The ModuLab XM MTS is a flexible and expandable materials characterization system designed for advanced research applications in electrochemistry, nanomaterials, and photovoltaics. It offers high precision, a wide measurement range, and modular configuration with specialized units.
Description
🟧 ModuLab XM Materials Test System
The ModuLab XM MTS can perform time domain (DC) and frequency domain (AC) tests. Accessories control temperature from cryostat to furnace level and integrate through software control with the core measurement electronics to create a system to study a wide range of materials. As with other ModuLab platform systems, it can be expanded for electrochemical or photoelectrochemical experiments.
✅ Widest impedance range – µohms to >100 TΩ
✅ Instant switching between time domain (IV, fast pulse) and AC (C-V, impedance, Mott-Schottky) measurements without changing sample connections
✅ Low frequency to 10 µHz for degradation, trap state, and material purity studies
✅ Plug and Play options include – Femto and Sample/Reference modes (for dielectric/insulators)
✅ XM–Studio software is included with all XM Series systems
✅ ModuLab XM MTS impedance accuracy contour plot highlights Solartron’s best-in-class measurement performance
🟧 Applications and Software
The ModuLab XM MTS can perform time domain (DC) and frequency domain (AC) tests. Accessories control temperature from cryostat to furnace levels and integrate through software control with the core measurement electronics to create a system to study a wide range of materials. As with other ModuLab platform systems, it can be expanded for electrochemical or photoelectrochemical experiments.
ModuLab XM MTS’s impedance accuracy contour plot highlights Solartron’s best-in-class measurement performance.
🟧 TheModuLab XM MTS is a modular system that can be configured for the following applications:
➡️ Dielectric Materials:
Ferro/piezoelectrics | MEMs | NEMs | Multiferroics
Polymers | Solid oxides (SOFC) | Ionic conductors
Solid electrolytes, Quantum dots
➡️ Electronic Materials:
LED | LCD | OLED | MEMs | OPV | Si | DSSC | OFET | Ge | GaAs | Perovskite materials
IDEAL FOR
✅ Materials characterization – Comprehensive analysis of material properties such as conductivity, dielectric behavior, and more.
✅ Electrochemical analysis – Study of batteries, supercapacitors, and fuel cells using techniques like Electrochemical Impedance Spectroscopy (EIS).
✅ Thin film characterization – Measurement of electrical and structural properties of thin layers and coatings.
✅ Nanomaterials research – Analysis of materials at the nanoscale for applications in sensors, electronics, and biomedicine.
✅ Photoelectrical characterization – Evaluation of photovoltaics and semiconductors under light excitation.
✅ Dielectric spectroscopy – Recording the dielectric response over a broad frequency range.
✅ R&D applications – Ideal for research labs and academic groups needing high-performance, customizable solutions.
