Thermomechanical analysis (TMA)
Thermomechanical Analysis (TMA) measures dimensional changes of a sample under controlled temperature and mechanical load, enabling precise evaluation of thermomechanical properties.
Thermo-Mechanical Analysis (TMA)
Change in sample geometry over temperature with additional sample load
With Thermomechanical Analysis (TMA), the change in sample geometry is measured under controlled temperature with additional mechanical loading. Static tests include expansion, penetration, tensile, compression, and 3-point bending tests.
By applying an oscillating force to the sample, dynamic thermomechanical analysis (dynamic TMA) records its frequency and temperature dependence, as well as its viscoelastic properties, enabling the determination of the modulus of elasticity and damping values.
All TMA systems operate in accordance with the following national and international standards: DIN 51005, ASTM D3386, ASTM E831, ASTM D696, and ISO 11359 (Parts 1–3).
TMA measuring devices
The concept
Both the temperature and the atmosphere can be controlled separately. An optional mass flow controller for regulating a purge gas is also available. The vacuum-tight measuring cell enables measurements under defined atmospheres, allowing even oxidation-sensitive samples to be analyzed reliably.
Furnace: A range of robust and reliable furnaces is available for the TMA Platinum series. The individual design enables extremely fast heat-up and cool-down times, as well as excellent temperature control over the entire measuring range.
Cryo Option for Temperatures down to 10 K
With the Cryo-Option, temperatures below 10 K are now possible. This results in a potential measuring range of approximately -263 °C to +220 °C, enabling even the most demanding low-temperature measurements.
In Dynamic Thermomechanical Analysis (DTMA), a known sinusoidal force and temperature profile are applied to the sample, and the resulting sinusoidal response is measured. This enables the investigation of the viscoelastic behavior of the sample. The force exerted on the probe changes automatically according to the specified frequency.
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