Nanotechnology
Hiden Analytical offers advanced quadrupole mass spectrometers designed for nanotechnology applications, including surface composition analysis, contaminant detection, and depth profiling. Instruments like the SIMS Workstation, FIB-SIMS, and TDSLab Series provide high-resolution insights essential for nanomaterials research and thin film characterization.
Nanotechnology
HPR-60 MBMS
The HPR-60 MBMS (molecular beam mass spectrometer) is optimised for the analysis of both positive (+ve) and negative (-ve) ions, as well as neutral and radicals, making it a robust solution for plasma and combustion analysis.
XBS
Multiple source deposition monitoring in MBE applications. High contamination resistant purpose designed quadrupole for deposition rate monitoring, source quality analysis and high performance vacuum diagnostics.
TDSLab Series
Thermal Desorption Spectrometry Systems for Advanced Materials Research. Offering precision, reliability, and versatility, for research and industry.
SIMS/SNMS Workstation
The SIMS Workstation combines dynamic and static SIMS analysis with a dual-mode mass spectrometer for positive (+ve) and negative (-ve) ion detection, and an additional secondary neutral mass spectrometry (SNMS) detection mode, for superior flexibility in surface analysis applications.
FIB-SIMS
High-performance bolt-on secondary ion mass spectrometry (SIMS) for existing focused ion beam (FIB) systems.
